Speaker
Romain Geneaux
(UC Berkeley)
Description
Broadband attosecond pulses are used for interface-sensitive scattering spectroscopy. Using a patterned silicon structure, the response of a 1.5 nm-thick native oxide layer is isolated. Attosecond transient reflectivity measurements are then performed on this system.
Authors
Romain Geneaux
(UC Berkeley)
Dr
Isvar A. Cordova
(Lawrence Berkeley National Laboratory)
Dr
Guillaume Freychet
(Lawrence Berkeley National Laboratory)
Dr
Peter M. Kraus
(UC Berkeley)
Dr
Alexander Guggenmos
(UC Berkeley)
Dr
Christian Spielmann
(Friedrich-Schiller-University Jena)
Dr
Michael Zürch
(UC Berkeley)
Dr
Cheng Wang
(Lawrence Berkeley National Laboratory)
Prof.
Daniel M. Neumark
(UC Berkeley)
Prof.
Stephen R. Leone
(UC Berkeley)
